Scanning Nonlinear Dielectric Microscopy
  • Author : Yasuo Cho
  • Release Date : 20 May 2020
  • Publisher : Woodhead Publishing
  • Genre : Technology & Engineering
  • Pages : 256
  • ISBN 13 : 9780081028032

Download or read book entitled Scanning Nonlinear Dielectric Microscopy written by Yasuo Cho and published by Woodhead Publishing online. This book was released on 20 May 2020 with total pages 256. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

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